By using high intensity X-ray synchrotron sources we have developed techniques to measure in situ time resolved x-ray diffraction with a time evolution of a few milliseconds. We have been using this technique to study the kinetics of systems when quenched through a first order phase transition and to study the crystallization of metallic glasses.
We have also been exploring the use of coherence in x-ray diffraction. In particular, we have measured speckle using 8keV x-rays and have developed techniques for intensity fluctuation spectroscopy.
We also have a program using x-ray reflectivity to study the structure of metallic thin films and their interfaces.
Finally, we are involved in the IBM-McGill-MIT Collaborative Access Team (IMMCAT) at Advanced Photon Source of Argonne National Laboratory.